196 lines
7.5 KiB
C
196 lines
7.5 KiB
C
/*
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* Copyright 2021 NXP.
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* All rights reserved.
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*
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* SPDX-License-Identifier: BSD-3-Clause
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*/
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#ifndef _SAFETY_CM33_LPC_H_
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#define _SAFETY_CM33_LPC_H_
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#include "safety_config.h"
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/*******************************************************************************
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* Definitions
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******************************************************************************/
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#define CPU_TEST_ERROR 0x1 /* CPU test fault flag */
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#define FLASH_TEST_ERROR 0x2 /* Flash test fault flag */
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#define RAM_TEST_ERROR 0x4 /* RAM test fault flag */
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#define STACK_TEST_ERROR 0x8 /* Stack test fault flag */
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#define CLOCK_TEST_ERROR 0x10 /* Clock test fault flag */
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#define PC_TEST_ERROR 0x20 /* Program counter test fault flag */
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#define CPU_PRIMASK_ERROR 0x40 /* PRIMASK test fault flag */
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#define CPU_REGISTERS_ERROR 0x80 /* CPU registers test fault flag */
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#define CPU_NONSTACKED_ERROR 0x100 /* non-stacked CPU test fault flag */
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#define CPU_CONTROL_ERROR 0x200 /* CONTROL register test fault flag */
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#define CPU_SPECIAL_ERROR 0x400 /* BASEPRI and FAULTMASK test fault flag */
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#define CPU_FLOAT_ERROR 0x800 /* FLOAT test fault flag */
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#define DIO_TEST_ERROR 0x1000 /* DIO test fault flag */
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#define AIO_TEST_ERROR 0x2000 /* AIO test fault flag */
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#define TSI_TEST_ERROR 0x4000 /* TSI test fault flag */
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#define WDOG_TEST_ERROR 0x8000 /* WDOG test fault flag */
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#define FS_FLASH_PASS 0x0 /* Flash test pass return */
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#define FS_FLASH_FAIL 0x00000301 /* Flash test fail return */
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#define FS_FLASH_PROGRESS 0x00000302
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#define SAFETY_CFG_PC_ADDR0 0x1FFFFFF8 /* #1 test address for Program counter test */
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#define SAFETY_CFG_PC_ADDR1 0x20000006 /* #2 test address for Program counter test */
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/*! @brief Safety tests */
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typedef struct _safety_common
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{
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uint32_t fastIsrSafetySwitch;
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uint32_t safetyErrors;
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uint32_t CLOCK_test_result;
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uint32_t FLASH_test_result;
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uint32_t RAM_test_result;
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uint32_t PC_test_result;
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uint32_t CPU_primask_s_test_result;
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uint32_t CPU_primask_ns_test_result;
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uint32_t CPU_special_s_test_result;
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uint32_t CPU_special_ns_test_result;
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uint32_t CPU_reg_test_result;
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uint32_t CPU_non_stacked_test_result;
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uint32_t CPU_control_s_test_result;
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uint32_t CPU_control_ns_test_result;
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uint32_t CPU_fpu_test_result;
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uint32_t STACK_test_result;
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uint32_t DIO_input_test_result;
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uint32_t DIO_output_test_result;
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uint32_t DIO_short_test_result;
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uint32_t AIO_test_result;
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uint32_t TSI_test_result;
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uint32_t WDOG_test_result;
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uint32_t cpuClkFreq;
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uint32_t mcgirclkFreq;
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uint32_t lpoFreq;
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} safety_common_t;
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/*! @brief Safety Watchdog test */
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typedef struct _wd_test
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{
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uint64_t wdTestTemp1;
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uint32_t wdTestExpected;
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uint32_t wdTestTolerance;
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uint32_t wdTestLptmrCnt;
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uint32_t wdTestLimitHigh;
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uint32_t wdTestLimitLow;
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uint32_t watchdogResets;
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uint32_t watchdogTimeoutCheck;
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uint16_t watchdogRefreshRatio;
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} wd_test_t;
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/*! @brief Safety Clock test */
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typedef struct _clock_test
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{
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uint32_t clockTestContext;
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uint32_t clockTestTolerance;
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uint32_t clockTestExpected;
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uint32_t clockTestLimitHigh;
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uint32_t clockTestLimitLow;
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uint32_t systickReloadValue;
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uint16_t clockTestStart;
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} fs_clock_test_t;
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/*! @brief Safety RAM test */
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typedef struct _ram_test
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{
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uint32_t ramTestStartAddress;
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uint32_t ramTestEndAddress;
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uint32_t blockSize;
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uint32_t actualAddress;
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uint32_t defaultBlockSize;
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uint32_t backupAddress;
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} fs_ram_test_t;
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/*! @brief Safety Flash test runtime */
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typedef struct _flash_runtime_test_parameters
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{
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uint32_t blockSize; /* size of tested block */
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uint32_t actualAddress; /* actual start address for crc module */
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uint32_t partCrc; /* seed in begin, particular crc result in process, crc result in final*/
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uint32_t finalCrc; /* CRC value after all blocsk is calculated */
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} fs_flash_runtime_test_parameters_t;
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/*! @brief Safety Flash test parameters */
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typedef struct _flash_configuration_parameters
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{
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uint32_t startConditionSeed;
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uint32_t startAddress;
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uint32_t endAddress;
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uint32_t size;
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uint32_t blockSize;
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uint32_t checksum;
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} fs_flash_configuration_parameters_t;
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/* CRC structure containing information for the offline CRC calculation. */
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typedef struct _fs_crc
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{
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uint16_t ui16Start;
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uint32_t ui32FlashStart __attribute__((packed));
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uint32_t ui32FlashEnd __attribute__((packed));
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uint32_t ui32CRC __attribute__((packed));
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uint16_t ui16End __attribute__((packed));
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} fs_crc_t;
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#ifdef __cplusplus
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extern "C" {
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#endif
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/*!
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* @name Safety Class B tests handling functions
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* @{
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*/
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/*******************************************************************************
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* API
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******************************************************************************/
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void SafetyWatchdogTest(safety_common_t *psSafetyCommon, wd_test_t *psSafetyWdTest);
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void SafetyWatchdogRuntimeRefresh(wd_test_t *psSafetyWdTest);
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void SafetyClockTestInit(safety_common_t *psSafetyCommon, fs_clock_test_t *psSafetyClockTest);
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void SafetyClockTestIsr(fs_clock_test_t *psSafetyClockTest);
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void SafetyClockTestCheck(safety_common_t *psSafetyCommon, fs_clock_test_t *psSafetyClockTest);
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void SafetyFlashTestInit(fs_flash_runtime_test_parameters_t *psFlashCrc,
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fs_flash_configuration_parameters_t *psFlashConfig);
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void SafetyFlashAfterResetTest(safety_common_t *psSafetyCommon, fs_flash_configuration_parameters_t *psFlashConfig);
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void SafetyFlashRuntimeTest(safety_common_t *psSafetyCommon,
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fs_flash_runtime_test_parameters_t *psFlashCrc,
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fs_flash_configuration_parameters_t *psFlashConfig);
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uint32_t SafetyFlashTestHandling(fs_flash_runtime_test_parameters_t *psFlashCrc,
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fs_flash_configuration_parameters_t *psFlashConfig);
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void SafetyRamTestInit(fs_ram_test_t *psSafetyRamTest, uint32_t *pSafetyRamStart, uint32_t *pSafetyRamEnd);
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void SafetyRamAfterResetTest(safety_common_t *psSafetyCommon, fs_ram_test_t *psSafetyRamTest);
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void SafetyRamRuntimeTest(safety_common_t *psSafetyCommon, fs_ram_test_t *psSafetyRamTest);
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void SafetyPcTest(safety_common_t *psSafetyCommon, uint32_t pattern);
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void SafetyCpuAfterResetTest(safety_common_t *psSafetyCommon);
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void SafetyCpuIsrTest(safety_common_t *psSafetyCommon);
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void SafetyCpuBackgroundTest(safety_common_t *psSafetyCommon);
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void SafetyStackTestInit(void);
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void SafetyStackTest(safety_common_t *psSafetyCommon);
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void SafetyDIOTestInit(safety_common_t *psSafetyCommon, fs_dio_test_lpc_t *pTestItems[]);
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void SafetyDigitalOutputTest(safety_common_t *psSafetyCommon, fs_dio_test_lpc_t *pTestedPin);
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void SafetyDigitalInputOutput_ShortSupplyTest(safety_common_t *psSafetyCommon,
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fs_dio_test_lpc_t *pTestedPin,
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uint8_t polarity);
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void SafetyDigitalInputOutput_ShortAdjTest(safety_common_t *psSafetyCommon,
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fs_dio_test_lpc_t *pTestedPin,
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fs_dio_test_lpc_t *pAdjPin,
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uint32_t PinValue);
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void SafetyAnalogTest(safety_common_t *psSafetyCommon);
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void SafetyIsrFunction(safety_common_t *psSafetyCommon,
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fs_ram_test_t *psSafetyRamTest,
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fs_ram_test_t *psSafetyRamStackTest);
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void development_test_terminate(void);
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void SafetyErrorHandling(safety_common_t *psSafetyCommon);
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#ifdef __cplusplus
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}
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#endif
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#endif /* _SAFETY_CM33_LPC_H_ */
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